
The book CNA Certified Nursing Assistant Exam Cram is written by Linda Whitenton, and Marty Walker. The certified nursing assistant exam, known as the exam, consists of a written exam (WE) and a clinical skills test (CST). The written (oral) exam content summary, as of 2016, also known as the National Nursing Assistant Assessment Program (NNAAP), is published by the National Council of State Boards of Nursing (NCSBN).
The written exam (WE) is a computerized exam with a time limit, usually two hours. Test sites are regional or local, depending on state jurisdiction. We recommend that you follow the instructions given by the test center without exception and arrive at least 30 minutes early or, if traveling a long distance, arrive a day early to locate the test center and the most judicious travel route to avoid delays.
Description:
Book Name | CNA Certified Nursing Assistant Exam Cram |
Author of Book | Linda Whitenton, Marty Walker |
Edition | 2nd |
Language | English |
Format | |
Category | Nursing Books |
Overview of CNA Certified Nursing Assistant Exam Cram
The CNA Certified Nursing Assistant Cram Exam 2nd Edition is the perfect study guide to help you pass the CNA Certified Nursing Assistant exam. It provides coverage and practice questions for each current exam topic and is fully revised to reflect the most recent NNAAP test plan. The book introduces you to an organized test preparation routine through the use of proven serial elements and techniques. Exam Alerts, sidebars, and notes interspersed throughout the text keep you focused on what you need to know. Test prep questions help you test your knowledge, and the Cram Sheet tear card is the perfect last-minute review.
Key features
The companion website provides access to the Cram Sheet and Pearson Test Prep practice test software that includes three practice tests, giving you an effective tool to assess your CNA exam readiness. Pearson Test Prep Practice testing software is available in both an online application and an offline Windows desktop application in multiple testing modes.
Topics of this Edition